Optical Metrology Tools
Optical Metrology Tools
Low cost R&D tool for film characterization - thickness, mapping & optical properties
Non-destructive characterization of coatings in the nano- and micro- scale Biosensors for PoN applications
Technology:
Technology:
White Light Reflectance Spectroscopy (WLRS) that allows accurate and simultaneous measurement of thickness and refractive index of stacked thin and thick films in ultra-wide range from few Angstroms to millimeters.
Application:
Application:
Optical metrology tool for the characterization of single layer and multi-layer coatings for a wide range of diverse applications
semiconductors,
organic electronics,
polymers,
paints and coatings,
photovoltaics,
biosensing