Characterization Tools

Thin-Film Metrology Solutions for Research, Development, and Production.

Thin Film Metrology

(MBE, MOCVD, PVD, PRD, Sputtering and E-Beam)

Scanning Acoustic Microscope

(Delam, Voids-bonded wafers and package inspection)

Sheet resistivity and CV Mapping system

(Sheet Resistance, Wafer Thickness, Metal Layer thickness)

Optical Metrology Tools

(Film Characterization)

CMOS Image Sensor

Report abuse