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El Camino Technologies Pvt. Ltd.
  • Home
  • Products
    • Front End
    • Back End
    • Characterization
    • Materials
  • Technologies
  • Join us
  • News
  • About us
  • Solar
El Camino Technologies Pvt. Ltd.
  • Home
  • Products
    • Front End
    • Back End
    • Characterization
    • Materials
  • Technologies
  • Join us
  • News
  • About us
  • Solar
  • More
    • Home
    • Products
      • Front End
      • Back End
      • Characterization
      • Materials
    • Technologies
    • Join us
    • News
    • About us
    • Solar

Products

Front-end

  • CleanRoom

  • Wet-Processing

  • Single Wafer Spin Process

  • Automatic Spin Processors

  • Diffusion & Deposition

  • Annealing

  • Ion Sources

  • CVD Tools

  • Plasma Cleaning & Etching Systems

Back-end

  • Bonders

  • Semiconductor Assembly Equipment

  • Processing Materials

  • Hermetic Package Sealing

  • Micro Abrasive Blasters

  • Reflow Solder Systems

  • Taping Equipment

  • Bond Testers

Characterization

Thin-Film Metrology Solutions for Research, Development, and Production.

1. Thin Film Metrology

2. optical metrology tools for the characterization of thin and thick films

3. Sheet resistivity and CV Mapping system

4. Scanning acoustic microscope for nondestructive inspection of bonded wafers, packaged semiconductors and industrial products.

Materials

  • Protecting Sensitive Devices

  • Semiconductor Bonding Tools

  • DOPANTS for Diffusion Sources

  • Materials for Thin film

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