Sheet resistivity & CV Mapping system
Advanced semiconductor probing systems for four-point probe and Mercury probe systems for measuring PN Junction and Sheet Resistivity including system for CV-Mapping.
Four point probe systems are for sheet resistivity measurements on a huge variety of materials including group-IV semiconductors, metals, and compound semiconductors, as well as new materials found in flat panel displays and hard disks.
Mercury probing systems use the liquid metal Mercury to form temporary electrical contacts for various electrical characterization techniques on numerous materials. Most commonly capacitance- voltage ( CV ) and current-voltage ( IV ) measurements are performed.
The instantaneous contact formed on semiconducting materials can be of MOS, MIS, or Schottky barrier type. This permits various electrical characterizations of for example silicon and compound semiconductors without the need of metal deposition processes.